介绍了多光谱分孔径同时探测系统的偏振定标方法。根据探测系统的特点，分析引起探测系统偏振效应的主要因素，包括偏振片消光比、装配误差导致的检偏器透过轴角度偏差和绝对光谱响应度；推导带有偏振片消光比、角度偏差和绝对光谱响应度的系统探测矩阵；设计具体实验，并求解系统探测矩阵中的未知定标数据；利用偏振度可调的光源对偏振定标方法及定标数据进行验证。结果表明，使用490，670，870，1610 nm波段，在输入偏振光的偏振度为20%时，测得偏振度的偏差分别为0.74%，0.01%，0.80%，0.59%，满足探测系统对实际偏振测量精度指标的要求。所提出的偏振定标方法有效可行，为该探测系统的实际应用提供了基础。

A polarization calibration method for a multi-spectral aperture-divided simultaneous detection system was introduced. According to characteristics of the detection system, the main factors causing polarization effect were analyzed, including polarizer extinction ratio, polarizer orientation angle deviation induced by assembly error and absolute spectral response. The system detection matrix with polarizer extinction ratio, angle deviation and absolute spectral response was derived. Experiments were designed to solve the unknown calibration data in the system detection matrix. The polarization calibration method and the calibration data were verified with a light source with adjustable polarization degree. The results showed that the measured polarization degrees were 0.74%, 0.01%, 0.80% and 0.59% when the polarization degree of input polarized light was 20% at 490, 670, 870, 1610 nm, which meets the requirement for actual polarization measurement precision in detection system. The proposed polarization calibration method is effective and feasible. The study may contribute to important basis for the practical application of the detection system.