光学技术, 2017, 43 (2): 108, 网络出版: 2017-04-10
一种基因芯片光学扫描图像倾斜校正方法研究
Study on skew correction method for gene-chip scanning image based on pixel gray
摘要
针对在基因芯片光学扫描时产生的图像倾斜问题, 提出了一种基于像素灰度的芯片图像倾斜校正方法。结合基因芯片图像的结构特点, 基于行、列方向像素灰度定义芯片图像的校正指标。在角度检测范围内, 利用折半搜索方法, 基于校正指标来检测芯片图像的校正角度和芯片图像的校正位置。实验结果表明, 该方法能有效地检测多类基因芯片图像的倾斜角度, 具有较强的鲁棒性和实用性。
Abstract
Based on pixel gray value, a skew correction method is proposed for the tilt image generated in gene-chip scanning. According to the structural characteristics of the gene-chip image, a correction index is determined based on gray of pixels on row and column. Within the range of angle detection, a binary search method is used to detect the skew angle of the gene-chip image based on the correction index. Strong robutstness and high performance of the skew correction method proposed are observed in experimental results when diffrent types of gene chip images are used.
刘全金, 赵志敏, 张文杰. 一种基因芯片光学扫描图像倾斜校正方法研究[J]. 光学技术, 2017, 43(2): 108. LIU Quanjin, ZHAO Zhimin, ZHANG Wenjie. Study on skew correction method for gene-chip scanning image based on pixel gray[J]. Optical Technique, 2017, 43(2): 108.