Chinese Optics Letters, 2017, 15 (8): 081301, Published Online: Jul. 20, 2018  

Polarization insensitive arrayed-input spectrometer chip based on silicon-on-insulator echelle grating Download: 864次

Author Affiliations
State Key Laboratory of Modern Optical Instrumentation, Centre for Integrated Optoelectronics, College of Optical Science and Engineering, Zhejiang University, Hangzhou 310027, China
Abstract
We demonstrate a polarization insensitive arrayed-input spectrometer using echelle diffraction grating (EDG) for hyperspectral imaging. The EDG consists of 65 input waveguides and 129 output waveguides, allowing spectral measurements of 65 image pixels at a time when used in combination with a micro-electromechanical system micro mirror array. The spectral resolution reaches 7.8 nm for wavelengths ranging from 1250 to 1700 nm. The measured loss is 2 dB, and the crosstalk is lower than 20 dB. The 3 μm silicon-on-insulator platform provides the device with polarization insensitive characteristics. The chip size is only 6 mm×10 mm.

Minyue Yang, Mingyu Li, Jianjun He. Polarization insensitive arrayed-input spectrometer chip based on silicon-on-insulator echelle grating[J]. Chinese Optics Letters, 2017, 15(8): 081301.

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