建立了一种液晶材料中微量有机膦杂质的FPD气相色谱分析测试方法, 可以同时测试液晶材料中微量三苯基氧膦和三苯基膦杂质。方法重现性好, 结果相对标准偏差(RSD, n=5)分别为 4.4%和5.6%, 有机膦杂质的添加回收率为80%~110%。实验对于液晶材料工业化过程中膦成分的分析方法建立具有较好的指导意义。

A FPD-GC method for determination of organic phosphorus impurities in liquid crystal material was established. The method with good reproducibility can be applied to simultaneous determination of triphenylphosphine and triphenylphosphine oxide. The relative standard deviations (RSD, n = 5) of triphenylphosphine oxide and triphenylphosphine were 4.4% and 5.6%. The recoveries ranged from 80% to 110%. The experiment has a good guiding significance to the establishment of the analytical method in the process of industrialization.