中国激光, 2017, 44 (9): 0901011, 网络出版: 2017-09-07
纳秒激光驱动的数千电子伏特 X射线背光面源特性 下载: 985次
Characteristics of Multi-keV X-Ray Area Backlighting Sources Driven by Nanosecond Laser
摘要
数千电子伏特(Multi-keV)量级的X射线背光成像是高能密度等离子体物理实验中常用的一种诊断技术。在神光II激光装置上, 研究了纳秒激光驱动钛4.7 keV波段及氯2.7 keV波段背光面源的性能。研究结果表明, 氯背光能谱以类He线及类H线为主, 其中2.7 keV波段的类He-α线最强; 在当前神光II激光加载能力下, 氯背光面源相对强度超过钛背光面源一个量级, 因此, 可选用氯He-α线的X光探针进行背光诊断。
Abstract
Multi-keV X-rays are used as backlighting sources of the radiography to diagnose plasmas in high energy density physics (HEDP) experiments. We study the characteristics of Ti-4.7 keV and Cl-2.7 keV X-rays driven by nanosecond laser at the SG-II laser facility. The results show that the X-rays from Cl plasma are primarily He-like and H-like line radiation, with 2.7 keV He-α line on the strongest line emission. In addition, the relative intensity of Cl X-rays is more than an order of magnitude compared to that of Ti X-rays under the current SG-II laser conditions. Therefore, the Cl X-rays can be used as the backlighting diagnosis.
熊俊, 安红海, 贾果, 王伟, 王琛, 王瑞荣, 方智恒, 董佳钦, 雷安乐. 纳秒激光驱动的数千电子伏特 X射线背光面源特性[J]. 中国激光, 2017, 44(9): 0901011. Xiong Jun, An Honghai, Jia Guo, Wang Wei, Wang Chen, Wang Ruirong, Fang Zhiheng, Dong Jiaqin, Lei Anle. Characteristics of Multi-keV X-Ray Area Backlighting Sources Driven by Nanosecond Laser[J]. Chinese Journal of Lasers, 2017, 44(9): 0901011.