研究了TFT-LCD的残影与驱动电路的关系。首先通过直流实验明确了驱动电路对残影会产生影响, 其次通过调节驱动频率证实了驱动电路中的数据线信号会对残影产生直接的影响, 最后通过改变数据线信号的极性证实了数据线信号的电势会影响残影的微观表现, 并对此进行了机理解释。分析表明驱动电路的极性是残影产生的必要条件, 通过调节电路的驱动模式能够改善残影。

Pattern delay has attracted great interest in a number of companies and institutes. In order to study the relationship between pattern delay and drive circuit in TFT-LCD, an experimental investigation of DC test was carried out and results showed that pattern delay could be influenced by drive circuit. Then, it was established that the potential of data had impact on the micro performance of pattern delay by adjusting the frequency. In the end, it was confirmed that the level of pattern delay was affected by the polarity of the data drive pattern. All the results show that the potential of data and drive pattern has strong influence on the defects. Mechanism and influencing factors of drive pattern were discussed, and methods for avoiding the failure were presented.