光电技术应用, 2017, 32 (6): 81, 网络出版: 2018-01-10
红外热像仪焦平面坏元实用检测方法
A Practical Focal Plane Bad Pixels Detection Method of Infrared Thermal Imager
摘要
红外热像仪焦平面由于材料、工艺、以及使用环境等原因不可避免地会存在坏元。首先在分析坏元红外图像特征的基础上, 使用实际采集的红外图像, 以5×5大小的窗口对所有焦平面像元进行逐一检测; 其次通过分别计算像元基于灰度水平和基于灰度方向变化率的坏元隶属度, 得到了坏元检测判据; 最后以实例检测验证了该方法的有效性。
Abstract
Due to materials, process and use environment, bad pixels exist in the focal plane of infrared thermal imager. Firstly, according to the analysis of infrared image characteristics of bad pixels and using collected IR picture, the pixels of the focal plane are detected one by one with a 5×5 window. Secondly, the bad pixel detection criterion is obtained through calculating the bad pixel membership degree based on the change of gray level and direction. Finally, the validity of the method is proved by an example.
阳平, 张辉. 红外热像仪焦平面坏元实用检测方法[J]. 光电技术应用, 2017, 32(6): 81. YANG Ping, ZHANG Hui. A Practical Focal Plane Bad Pixels Detection Method of Infrared Thermal Imager[J]. Electro-Optic Technology Application, 2017, 32(6): 81.