多峰颗粒体系粒度及其分布的测量是动态光散射技术的难点, 本文在Tikhonov正则化方法的目标函数中加入具有平坦约束功能的惩罚项, 增强对解的约束提高对多峰颗粒体系的反演性能.190/443 nm、282/953 nm、457/553 nm双峰分布颗粒体系、564 nm单峰分布颗粒体系和292/591/889 nm三峰颗粒体系的模拟数据, 以及306/974 nm、300/502 nm双峰颗粒体系的实测数据的反演表明, 在正则化反演中增加具有平坦约束功能的惩罚项, 可有效消除反演的颗粒粒度分布中出现的毛刺与虚假峰, 提高算法的峰值分辨能力和抗噪能力.该研究在发挥多角度动态光散射技术测量中、大超细颗粒时具有信息量多的优势, 实现宽范围的双峰及多峰分布颗粒体系的准确测量.

It is difficult to measure the particle size distribution for multi-modal particle system in dynamic light scattering technique, because of the ill posed problem in the data inversion. In this paper, the smooth constraint penalty term is added to the objective function of Tikhonov regularization, to improve the performance of inversion by enhancing the constraint to the solution. Three groups of simulated bimodal particle system (190/443 nm, 282/953 nm, 457/553 nm), one group of simulated unimodal particle system (564 nm), and one group of simulated trimodal particle system (292/591/889 nm), as well as two groups of experimental particle system (306/974 nm, 300/502 nm), were tested in this paper. The results show that, in the regularization inversion, adding the smooth constraint penalty term, can effectively eliminate the spike and spurious peaks in reversed particle size distribution, improve the resolution of particle size distribution and increase the ability of noise reduction, which, sequentially can make better use of the advantage that Multi-angle Dynamic Light Scattering (MDLS) technique could be able to provide more ultrafine particle size distribution information in medium and large size range, and then realize the accurate bimodal and multi-modal particle measurement from nanometer to submicron size range.