研究了静电放电(ESD)人体模式(HBM)下的脉冲应力对有机发光二极管(OLED)的性能及寿命的影响, 并讨论了相应的物理机制。对比分析了4组OLED在施加ESD放电为0, 200,800,1 600 V前后的电学和光学特性, 并进行了相应的寿命测试分析。研究发现, OLED器件的光谱对ESD不敏感, 随着冲击电压的增大, 由于静电打击对载流子的短期抑制效应, OLED的亮度出现轻微下降。在静电冲击电压为200 V和800 V时, 伏安特性没有发生变化; 当静电冲击电压增至1 600 V时, 反向漏电有明显增加。后续的加速寿命实验表明, 静电打击对器件的工作寿命没有明显的规律性影响, 但是会一定程度提高非本质老化失效的概率。

The electro-static discharge (ESD) performance of the organic light emitting diodes was investigated experimentally at the human body model equivalent pulses by utilizing the transmission line pulsing (TLP) tester. ESD with 200, 800, 1 600 V was applied on four groups OLEDs. The electrical and optical characteristics of OLEDs were analyzed before and after ESD stress. The lifetime tests were carried out for the fresh samples and the devices undergoing ESD stresses. The experiment results show that the electro-luminescence spectra of OLEDs are insensitive to ESD. Because of the short term inhibition effect of ESD on the carriers, the luminance of OLEDs decreases slightly with the increasing of the strike voltage. When the strike voltages are 200 and 800 V, I-V characteristics of OLEDs dont change. When the strike voltage is 1 600 V, the leakage current increases obviously. The accelerated life test results show that ESD has no obvious regular influence on the life of OLEDs, but it will increase the probability of non essential aging failure to a certain extent.