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Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

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Abstract

Electronic speckle pattern interferometry (ESPI) and digital speckle pattern interferometry are well-established non-contact measurement methods. They have been widely used to carry out precise deformation mapping. However, the simultaneous two-dimensional (2D) or three-dimensional (3D) deformation measurements using ESPI with phase shifting usually involve complicated and slow equipment. In this Letter, we solve these issues by proposing a modified ESPI system based on double phase modulations with only one laser and one camera. In-plane normal and shear strains are obtained with good quality. This system can also be developed to measure 3D deformation, and it has the potential to carry out faster measurements with a high-speed camera.

Newport宣传-MKS新实验室计划
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DOI:10.3788/col201816.071201

所属栏目:Instrumentation, measurement and metrology

基金项目:This work was financially supported by the ANR Micromorfing Program (ANR-14-CE07-0035), China Scholarship Council (CSC), and the Labex Action.

收稿日期:2018-03-15

录用日期:2018-05-08

网络出版日期:2018-06-28

作者单位    点击查看

Yunlong Zhu:ICD-L2N, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France
Julien Vaillant:ICD-L2N, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, FranceICD-LASMIS, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France
Guillaume Montay:ICD-LASMIS, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France
Manuel Fran?ois:ICD-LASMIS, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France
Yassine Hadjar:ICD-L2N, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France
Aurélien Bruyant:ICD-L2N, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France

联系人作者:Aurélien Bruyant(aurelien.bruyant@utt.fr)

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引用该论文

Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel Fran?ois, Yassine Hadjar, Aurélien Bruyant, "Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations," Chinese Optics Letters 16(7), 071201 (2018)

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