光电工程, 2018, 45 (7): 180100, 网络出版: 2018-08-04   

适用于离焦状态相机的相位编码标定方法

Camera calibration method based on phase encoding for out-of-focus condition
作者单位
1 浙江大学现代光学仪器国家重点实验室国家光学仪器工程技术研究中心,浙江 杭州 310027
2 浙江大学台州研究院,浙江台州 318000
3 浙江大学现代光学仪器国家重点实验室国家光学仪器工程技术 研究中心,浙江 杭州 310027
摘要
现阶段通用的相机标定方法需要使用者提供准确的标定板特征点像素坐标。但对某些成像位置特殊的相机而言,一般标定物(如长宽在厘米级别的标定板)的使用范围在其清晰成像范围之外。使用这些相机拍摄一般标定物,只能得到离焦的模糊图像,无法准确提取特征点像素坐标。本文分析了光学系统离焦状态对基于正弦光栅的结构光(简称正弦结构光)相位的影响。利用正弦结构光相位与相机对焦状态无关的性质,提出了一种利用相移法正弦结构光编码的方法,对标定物上特征点进行相位编码,实现了相机在离焦状态下的标定。经过实验验证,标定结果焦距长度与真实值之间最大偏差为0.47%,最大像素重投影误差为0.17 pixels。该方法为具有特殊成像范围的相机的标定提供了一种解决方案。
Abstract
The state-of-art camera calibration method requires the user to provide accurate pixel coordinates of calibration plate feature points. For some cameras with special sensing range, general calibration objects’ (such as calibration plates with a centimeter-long dimension) using range is outside their clear sensing range. Using these cameras to take a picture for general calibration objects, you can only get out-of-focused blurred images that can not accurately extract feature points’ pixel coordinates. This paper analyzes the influence on the phase of the structured light based on sine grating (abbreviated as sinusoidal structured light) when optical system is in defocus state. Based on the fact that the state of focus is independent of the phase of sinusoidal structured light, a method of phase-shifted sinusoidal structured light encoding by phase shift is proposed to encode the feature points on the calibration object and this method realizes the calibration of the camera under out-of-focus condition. The experimental results show that the maximal deviation of focal length from the real value is 0.47% and the maximal pixel reprojection error is 0.17 pixels. This paper provides a solution to camera calibration with a special sensing range.

杨浩, 蔡宁, 林斌, 曹向群. 适用于离焦状态相机的相位编码标定方法[J]. 光电工程, 2018, 45(7): 180100. Yang Hao, Cai Ning, Lin Bin, Cao Xiangqun. Camera calibration method based on phase encoding for out-of-focus condition[J]. Opto-Electronic Engineering, 2018, 45(7): 180100.

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