材料表面发射率是描述物体热辐射特性的重要参数, 与辐射传热设计、测温、热像检测和**隐身等技术密切相关。综述了量热法、能量法和多波长法测量材料表面发射率的研究进展, 分析了材料发射率及其测量不确定度的影响因素, 介绍了发射率测量标准样品的研制及国际间比对, 最后展望了该领域的发展趋势。

Material surface emissivity is an important thermophysical property for radiation heat transfer, thermometers, thermography testing, infrared stealth, among others. In this paper, we review the techniques for measuring emissivity, such as calorimetric, energy comparison, and multi-wavelength techniques; describe the factors influencing material surface emissivity and the main uncertainty contribution for emissivity measurement; and introduce emissivity standard reference materials and perform an inter- comparison of emissivity measurements. Finally, we analyze the progress trend in this field.