光子学报, 2018, 47 (5): 0512001, 网络出版: 2018-09-07  

基于线面模型的偏折术测量方法

Deflectometry Measurement Based on Line-plane Model
作者单位
上海大学 机电工程与自动化学院, 上海 200072
摘要
将传统的反射光线与入射光线求交问题转化为反射光线与入射光线所在平面的求交问题并构建线面模型.使用点光源替代传统连续面光源, 通过检测入射光线上两点或多点光源的投射光线确定入射光平面, 通过反射光线和入射光平面求交确定镜面三维点.基于镜面位姿标定方法提出线面偏折术系统的标定方法, 只需一次标定即可用于镜面测量.仿真分析了位姿关系标定结果对系统重建精度的影响.系统测量最大误差为0.25 mm, 误差均方根值为0.073 mm.实验验证了所提方法的可行性, 实验结果表明该方法具有较高的测量精度.
Abstract
The intersection issues between the reflected light and the incident light are transformd into the intersection problems between the reflected light and the plane containing the incident light, and the line-plane model is constructed. The point light source is used to replace the traditional continuous surface light source, and the incident light plane is determined by detecting the projected lights of two or more light source points on the incident light. Then the mirror point is determined by the intersection between the reflected light and the incident light plane. The calibration method for line-plane deflectometry is proposed on the basis of the mirror calibration method, which can be used for specular measurement with only once calibration. The effect of the posed relationship on reconstruction accuracy of the system is analyzed in simulations. The maximum error of system measurement is 0.25 mm, the root mean square error is 0.073 mm. Experiments verify the feasibility of the proposed methods, and the experimental results show that the method has high accuracy.

李晨, 张旭, 屠大维. 基于线面模型的偏折术测量方法[J]. 光子学报, 2018, 47(5): 0512001. LI Chen, ZHANG Xu, TU Da-wei. Deflectometry Measurement Based on Line-plane Model[J]. ACTA PHOTONICA SINICA, 2018, 47(5): 0512001.

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!