光学仪器, 2018, 40 (4): 1, 网络出版: 2018-09-15  

基于后向光散射的颗粒测量技术研究

Particle size analysis based on backward-scattered light
作者单位
上海理工大学 理学院, 上海 200093
摘要
颗粒粒径和颗粒折射率是光散射颗粒测量技术中的重要参数。为了实现颗粒粒径的测量及其分档, 在广义Mie理论基础上, 分析了颗粒粒径及折射率对后向散射光能分布的影响, 并得到了后向散射光能分布随颗粒粒径及折射率呈周期变化规律。实验验证结果表明, 后向散射光能与颗粒粒径及颗粒浓度有关。研究结果可为后续的颗粒测量研究提供参考。
Abstract
Particles size and refractive index of particles are important parameters in the analysis of particles based on light scattering.In order to obtain the information of particle size and distribution, we have computed the angular distribution of backward-scattered light with different particle sizes and refractive indices based on the generalized Lorenz-Mie theory.It is found that the backward-scattered light varies cyclically according to the variation of the product of particle size and the refractive index.Experiments are conducted to verify the theoretical analysis and it is shown that the backward-scattered signal depends on the particle size and the particle concentration.The study provides theoretical foundation for the particle size measurements.

卢松芳, 沈建琪. 基于后向光散射的颗粒测量技术研究[J]. 光学仪器, 2018, 40(4): 1. LU Songfang, SHEN Jianqi. Particle size analysis based on backward-scattered light[J]. Optical Instruments, 2018, 40(4): 1.

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