在短波红外成像光谱技术的应用背景下,对HgCdTe短波红外焦平面探测器的校正技术进行研究,包括坏像元校正和非均匀性校正,并提出先进行坏像元校正后进行非均匀性校正的探测器校正原则;在标准辐射源下,对正常像元的输出值进行正态分布拟合,并通过3σ准则设定正常像元输出值阈值的方法,确定探测器中坏像元的数量与位置,然后根据短波红外成像光谱技术的应用要求,对坏像元进行光谱二邻域均值替换;坏像元校正完成后,再采用运算量小、实时性强的两点法对探测器进行非均匀性校正。综合校正结果表明:探测器坏像元得到有效剔除,坏像元输出值得到良好校正,且非均匀性校正效果明显,图像细节更加丰富。

Under the background of the short-wave infrared imaging spectroscopy application, we study a set of corrections of HgCdTe short-wave infrared focal plane arrays, including defective pixel correction and non-uniformity correction, and propose the correction principle of non-uniformity correction after defective pixel correction. Under standard radiation sources, the normal distribution of normal pixel output values is fitted, and the threshold of normal pixel output is set by the 3σ criterion to determine the number and the location of defective pixels in the detector. Then according to application requirements of short-wave infrared imaging spectroscopy, the spectral two-neighborhood mean replacement is applied to the defective pixels. After the defective pixel correction is completed, the non-uniformity correction of the detector is carried out by the two-point method with small calculation amount and strong real-time performance. The comprehensive correction results show that the defective pixels of the detector are effectively eliminated, the output values of defective pixels are well corrected, the effect of non-uniformity correction is obvious, and the image details are more abundant.