基于施密特系统的基本原理,设计了一种用于光谱仪消像差的施密特校正板,得到了该校正板的面形方程和面形图。利用ZEMAX软件模拟和分析了加入施密特校正板前后光谱仪系统的成像特性。结果表明:波长为350,550,700 nm时,原始光谱仪像面点斑的均方根(RMS)半径分别为515.843,563.074,885.820 μm,而带有施密特校正板光谱仪像面点斑的RMS半径分别为287.441,252.774,511.816 μm。施密特校正板使点斑尺寸在波长为350,550,700 nm时,分别缩小了44.28%、55.11%、42.23%。所提出的施密特校正板设计方法为改善光谱仪的分辨率提供了技术参考。

A Schmidt corrector plate for cancelling the aberrations of spectrometers is designed based on the principle of a Schmidt system. A formula for the surface shape and a surface map of the Schmidt corrector plate are derived. Then, the imaging characteristics of the spectrometer systems with and without the Schmidt corrector plate installed are simulated and analyzed using the ZEMAX software. The results show that for the wavelengths of 350, 550, and 700 nm, the root-mean-square (RMS) radii of light spots on the image plane of the original spectrometer are 515.843, 563.074, and 885.820 μm, respectively. In contrast, with the Schmidt corrector plate installed, the RMS radii of light spots on the image plane are 287.441, 252.774, and 511.816 μm, respectively. For the wavelengths of 350, 550, and 700 nm, the spot sizes with the Schmidt corrector plate installed are reduced by 44.28%, 55.11%, and 42.23%, respectively. The proposed method for designing a Schmidt corrector plate provides a technical reference for improving the resolution of spectrometers.