研究了狭缝光栅开口率和3D串扰之间的关系。先采用固定式的狭缝光栅显示器件进行实验, 发现2%~4%光栅开口率的增加导致了0.2%~2%串扰的增加, 初步验证了“光栅开口率越高, 3D串扰越大”的规律。考虑到2D显示产品的个体性能差异以及在贴合过程中的操作误差都可能对这个结果产生影响, 又用TN 盒制作成活动式狭缝光栅, 通过改变电压来改变狭缝光栅的开口率, 从而在其他条件都一致的情况下, 测试出狭缝光栅透过率和3D串扰之间的关系。对于2视点的裸眼3D设备, 随着控制电压从4 V增大到15 V, 串扰逐步减小了1.6%, 从而最终确认了“开口率越高, 3D串扰越大”的规律。

The relationship between parallax barrier opening ratio and auto-stereoscopic crosstalk was researched. Firstly, the fixed barriers with different aperture opening ratios were used to make 3D display and the rules were verified: the bigger the aperture opening ratio is, the bigger the 3D crosstalk will be (2%~4% increase of opening ratio can lead to 0.2%~2% increase of 3D crosstalk). However, the difference between 2D panels was not small and the manufacture of 3D panels might induce some offset, so the active barriers were used to verify the rule again. With a TN cell working as a parallax barrier, by modifying the operation voltage, the transmittance was changed, but other factors kept the same. For a 2view 3D display, when the operation voltage of parallax barrier increased from 4 V to 15 V, its 3D crosstalk decreased by 1.6% gradually. The results of this experiments lead to the rule: the bigger the aperture opening ratio is, the bigger the 3D crosstalk will be.