光学技术, 2020, 46 (1): 14, 网络出版: 2020-04-13   

基于三维缺陷检测的双光路双远心光学系统设计

Design of Bi-telecentric optical system with two-path configuration for 3-D defect inspections
作者单位
上海理工大学 光电信息与计算机工程学院, 上海 200093
摘要
针对基于SMT技术生产的PCB板产品的三维缺陷检测问题, 设计了一款高分辨率、高远心度及低畸变的双光路双远心光学系统。它通过远心投影物镜经共光路物镜将DMD数字条纹均匀投影至待测物面, 同时经由共光路物镜和成像物镜收集物面反射条纹光至CMOS接收面。使用ZEMAX光学软件分别对三部分镜组进行优化设计, 分析了系统的像差和调制传递函数。设计结果表明: 共光路物镜部分采用长工作距离、大视场角及物方远心结构, 空间频率50lp/mm处, 各视场的MTF接近衍射极限; 投影光路畸变小于0.1%, 在投影面上全视场范围MTF在6lp/mm处大于0.8且条纹周期均匀; 成像光路畸变小于0.05%, 在全视场范围MTF在80lp/mm处大于0.3。仿真成像结果表明,在离焦量为+/-6mm时仍能达到景深范围内分辨率要求, 能有效提高3D AOI检测质量。且双光路双远心系统所用材料基本为普通玻璃且重复率较高, 利于加工和节省成本。
Abstract
According to the 3D Automatic Optical Inspection (AOI) of print circuit boards (PCB) produced by surface mounted technology (SMT), the design of a bi-telecentric optical system with high resolution, high telecentricity and low distortion was introduced . The fringes produced by digital micro-mirror device (DMD) are projected uniformly onto the object plane by telecentric projection lens and common-path lens. Concurrently, the reflected fringes are collected to CMOS by common-path and imaging lens. The three parts of the system designed and optimized respectively by ZEMAX and their aberration and MTF were analyzed. The design result shows that the common-path lens have long work distance, large field of view (FOV) and object telecentic structure, the MTF of each FOV approaches the diffraction limit at 50lp/mm. The distortion of projection path is less than 0.1%, its MTF at 6lp/mm is more than 0.8 in the whole FOV and the fringe period is uniform. The distortion of imaging path is less than 1%, its MTF is more than 0.3 at 80lp/mm in the whole FOV and the reflected fringes remain clear within a depth of focus of +/-6mm. The optical system can effectively improve the test quality of 3D AOI. Besides, ordinary material was used in the system in order to facilitate machining and cut costs.

韦晓孝, 李雪宸, 万新军, 张薇. 基于三维缺陷检测的双光路双远心光学系统设计[J]. 光学技术, 2020, 46(1): 14. WEI Xiaoxiao, LI Xuechen, WAN Xinjun, ZHANG Wei. Design of Bi-telecentric optical system with two-path configuration for 3-D defect inspections[J]. Optical Technique, 2020, 46(1): 14.

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