在分析CCD相机噪声特性的基础上, 设计了一种用于CCD相机电子学增益测试的新方法。该方法采用任意场景作为测试背景, 通过改进算法推导了图像信号SDN和图像噪声σDN之间的线性关系, 从而解算出相机的电子学增益。与传统方法采用积分球或EMVA1288标准要求的均匀光源相比, 该方法具有操作简便、经济性高的特点。与原有算法进行对比实验, 结果表明, 该方法能够较精确地对CCD相机电子学增益进行测试, 测试重复性高, 且有效可靠。

Based on analyzing the noise properties of CCD camera, a new method was proposed for testing its electronic gain. Applying arbitrary scene, the linear relationship between the image signal SDN and the image noise σDN was deduced with an improved algorithm, and the electronic gain of the CCD camera was calculated. Different from the traditional methods which apply integrating sphere or uniform light source required by EMVA 1288 standard, the new method presents the characteristics of simple operation and high economy. Comparison experiments were performed between the traditional and the proposed methods, and the results indicate that, the new method can test the electronic gain of CCD cameras precisely and effectively with a high repeatability.