激光与光电子学进展, 2020, 57 (5): 051201, 网络出版: 2020-03-05
基于投影栅相位法和独立分量分析的强反射表面形貌测量 下载: 951次
Profile Measurement of High-Reflective Surface Based on Projected Fringe Profilometry and Independent Component Analysis
测量 投影栅相位法 独立分量分析 强反射表面 measurement projected fringe profilometry independent component analysis high-reflective surface
摘要
提出了一种结合独立分量分析(ICA)算法的投影栅相位法,用于实现强反射表面三维形貌的测量。分析了强反射表面的反射光(主要由镜面反射光以及漫反射光组成)的模型及其特点。针对镜面反射光的偏振特性,通过在CCD摄像机镜头前加装偏振片,可以对镜面反射光进行初步的滤除。同时旋转偏振片,以获得不同角度下的偏振图像。利用反射光模型并结合独立分量分析算法,将镜面反射光分量以及漫反射光分量进行分离。最后使用漫反射光分量图像对物体进行三维重建。实测了一块表面光滑的铝合金工件,验证了该方法的可行性。
Abstract
A method that combines projected fringe profilometry with independent component analysis (ICA) is proposed to realize the three-dimensional profile measurement of high-reflective surfaces. The reflection model and characteristics of reflection light from high-reflective surfaces are analyzed. The reflection light is mainly composed of specular and diffuse components. Considering the polarization property of the specular light, we put a polarizer before the CCD camera to eliminate the specular light primarily. Then, the polarization images at different angles can be captured by rotating the polarizer, and the separation of specular and diffuse components can be realized by using the reflection model combined with ICA. Finally, the images of diffuse components can be applied to the three-dimensional reconstruction. A smooth aluminum alloy sheet is measured, and the feasibility of the proposed method is verified.
张翼翔, 张连新. 基于投影栅相位法和独立分量分析的强反射表面形貌测量[J]. 激光与光电子学进展, 2020, 57(5): 051201. Yixiang Zhang, Lianxin Zhang. Profile Measurement of High-Reflective Surface Based on Projected Fringe Profilometry and Independent Component Analysis[J]. Laser & Optoelectronics Progress, 2020, 57(5): 051201.