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基于反射云纹的抛光曲面表面缺陷检测研究

Surface Defect Detectionon Polished Surface Based on Reflection Moiré

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摘要

针对抛光曲面工件表面缺陷检测的问题,提出了一种基于反射云纹图像的缺陷检测方法。该方法利用云纹光经抛光曲面反射产生的差异,通过检测云纹图像的变化进行缺陷的检测与定位。分析了抛光曲面的光照模型,使用SHEN-Castan算法抑制云纹边缘阶梯效应,通过Gabor变换与最大熵分割进行缺陷提取,剔除伪缺陷后实现缺陷的检测与定位。实验结果与统计表明,设计的方法能检测出抛光曲面表面上具有形变特征的缺陷,对不同类型的表面缺陷均有92%以上的检出率。利用所提的检测方法,可以自主设置系统的检测分辨率,对不同类型的缺陷具有较高的适应性,极大地提高了系统的可拓展性、普适性与实用性,较好地解决了高反射抛光曲面工件表面形变缺陷检测的问题,具有较高的理论价值与经济价值。

Abstract

This study proposed a defect detection method based on the reflection moiré images to efficiently detect defects on the polished surface of a workpiece. The proposed method located defects by detecting variations in the moiré image reflected by the polished surface. The illumination model of the polished surface was analyzed, and the SHEN-Castan algorithm was used to suppress the edge-step effect of the moiré. Defects were detected and located after performing defect extraction to remove false defect via Gabor transform and maximum entropy segmentation. Experimental results and statistics show that the proposed method can detect surface defects on different polished workpiece surfaces at a detection rate of >92%. The proposed method can be used to independently set the detection resolution ratio of a system, thereby increasing the system’s adaptability to detect different types of defects and considerably improving its extensibility, universality, and practicability. Thus, the proposed method can efficiently detect defects on highly reflective polished workpiece surfaces and has great theoretical as well as economic value.

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DOI:10.3788/LOP56.141501

所属栏目:机器视觉

基金项目:国家自然科学基金、桂林市科学研究与技术开发课题;

收稿日期:2018-12-18

修改稿日期:2019-02-17

网络出版日期:2019-07-01

作者单位    点击查看

熊显名:桂林电子科技大学电子工程与自动化学院, 广西 桂林, 541004广西高校光电信息处理重点实验室, 广西 桂林, 541004
石红强:桂林电子科技大学电子工程与自动化学院, 广西 桂林, 541004
曾星宇:桂林电子科技大学电子工程与自动化学院, 广西 桂林, 541004

联系人作者:熊显名(5311128@qq.com)

备注:国家自然科学基金、桂林市科学研究与技术开发课题;

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引用该论文

Xianming Xiong, Hongqiang Shi, Xingyu Zeng. Surface Defect Detectionon Polished Surface Based on Reflection Moiré[J]. Laser & Optoelectronics Progress, 2019, 56(14): 141501

熊显名, 石红强, 曾星宇. 基于反射云纹的抛光曲面表面缺陷检测研究[J]. 激光与光电子学进展, 2019, 56(14): 141501

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