Chinese Optics Letters, 2019, 17 (1): 011201, Published Online: Jan. 17, 2019   

Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view Download: 672次

Author Affiliations
1 Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
2 University of Chinese Academy of Sciences, Beijing 100049, China
Abstract
Single layer lattice graphene deposited on the metal substrate can hardly be imaged by the optical microscope. In this Letter, a large field-of-view imaging ellipsometer is introduced to image single layer graphene which is deposited on a metal substrate. By adjusting the polarizer and the analyzer of imaging ellipsometer, the light reflected from surfaces of either single layer graphene or a Au film substrate can be extinguished, respectively. Thus, single layer graphene can be imaged correspondingly under brightfield or darkfield imaging modes. The method can be applied to imaging large-area graphene on a metal substrate.

Guiyun Li, Liyuan Gu, Jingpei Hu, Linglin Zhu, Aijun Zeng, Huijie Huang. Imaging method of single layer graphene on metal substrate based on imaging ellipsometer with large field of view[J]. Chinese Optics Letters, 2019, 17(1): 011201.

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