光学学报, 2020, 40 (16): 1612001, 网络出版: 2020-08-07   

一种基于多次反射像的三维测量方法 下载: 1038次

A Three-Dimensional Measurement Method Based on Multiple Reflected Images
作者单位
华南理工大学物理与光电学院, 广东 广州 510641
摘要
采用多目结构光对金属类物体进行三维测量时,由于反射光强随角度变化极大,各相机获得的结构光图像会有明显差异,从而降低了图像的匹配程度;在某些反射强烈的位置,杂散光甚至会造成线结构光无法测量的情况。此外,使用同一参数对图像进行匹配或处理时,在反射率和反射性能差别较大的材料同时出现的情况下,测量精度会比较差。针对上述问题,提出一种基于形成多次反射成像的结构光三维测量方法以及仪器标定方法。此方法通过建立多次反射像对应点的图像坐标与空间坐标的关系来解算结构光像点的空间坐标。实验结果表明,该方法在一定程度上克服了用结构光测量高反表面时遇到的亮度反差大和高反问题,其测量精度在本实验平台上达到了±0.1 mm的工程要求。
Abstract
When multi-view structured light is used for three-dimensional measurement of metallic objects, the structured light images obtained by each camera exhibit obvious differences because the reflected light intensity significantly changes with the angle; thus, the degree of matching of images is reduced. At some locations with strong reflections, stray light can even render the measurement of line structured light impossible. Moreover, when the same parameter is used to match or process the image, the accuracy of the measurement is poor if materials with large differences in reflectivity and reflection performance are simultaneously encountered. To mitigate these problems, a three-dimensional structured light measurement method and an instrument calibration method based on the formation of multiple reflected images are proposed. The three-dimensional structured light measurement method solves the spatial coordinates of structured light image points by establishing a relation between the image and spatial coordinates of the corresponding points of the multiple reflected images. Experimental results indicate that to a certain extent, this method overcomes the problems of large brightness contrast and high reflectance encountered in structured light measurement of high-reflection surfaces. Moreover, the measurement accuracy in our experimental platform reaches the engineering requirement of ±0.1 mm.

徐顺雨, 徐晓. 一种基于多次反射像的三维测量方法[J]. 光学学报, 2020, 40(16): 1612001. Shunyu Xu, Xiao Xu. A Three-Dimensional Measurement Method Based on Multiple Reflected Images[J]. Acta Optica Sinica, 2020, 40(16): 1612001.

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