激光与光电子学进展, 2016, 53 (7): 071405, 网络出版: 2016-07-08   

光电反馈1550 nm垂直腔表面发射激光器偏振双稳特性

Polarization Bistability Characteristics of 1550 nm Vertical-Cavity Surface-Emitting Laser Under Optoelectronic Feedback
作者单位
西南大学物理科学与技术学院, 重庆 400715
摘要
研究了光电反馈对1550 nm垂直腔表面发射激光器(1550 nm-VCSEL)中偏置电流沿不同路径连续变化而导致的偏振双稳特性的影响。研究结果表明:自由运行1550 nm-VCSEL的偏置电流在逐渐增加的过程中会产生Ⅰ类偏振开关(PS),而在电流逐渐减小的过程中会产生Ⅱ类PS,Ⅰ类PS和Ⅱ类PS的开关点电流具有不同的值,即自由运行1550 nm-VCSEL呈现出偏振双稳(PB)特性;引入光电正反馈后,Ⅰ类PS和Ⅱ类PS的开关点电流在不同的反馈强度下会有所改变,双稳环宽度随反馈强度的增加呈现逐渐减小的趋势;引入光电负反馈后,Ⅰ类PS和Ⅱ类PS的开关点电流随着反馈强度的增加变化比较复杂,双稳环宽度总体呈现下降的趋势,但下降过程中伴随着较大波动。
Abstract
The influences of optoelectronic feedback on the polarization bistability in a 1550 nm vertical-cavity surface-emitting laser (1550 nm-VCSEL) resulting from continuously varying the bias currents along different paths are investigated experimentally. The results show that, typeⅠpolarization switching (PS) can be generated in a free-running 1550 nm-VCSEL through gradually increasing the bias current, while typeⅡPS emerges during the process of gradually decreasing the bias current. The bias currents of typeⅠPS and typeⅡPS point possess different value, i. e. polarization bistability (PB) appears in the free-running 1550 nm-VCSEL. After introducing positive optoelectronic feedback, the bias currents of typeⅠPS and typeⅡPS points are accordingly varied for different feedback strengths, and the width of the bistability loop shows a gradually decreasing trend with the increase of the feedback strength. After introducing negative optoelectronic feedback, the variations of the currents of typeⅠPS and typeⅡPS points are more complex with the increase of feedback strength, and the width of the bistability loop shows a generally decreasing trend with obvious fluctuation.

黄守文, 陈建军, 夏光琼*, 杨欣, 吴正茂. 光电反馈1550 nm垂直腔表面发射激光器偏振双稳特性[J]. 激光与光电子学进展, 2016, 53(7): 071405. Huang Shouwen, Chen Jianjun, Xia Guangqiong, Yang Xin, Wu Zhengmao. Polarization Bistability Characteristics of 1550 nm Vertical-Cavity Surface-Emitting Laser Under Optoelectronic Feedback[J]. Laser & Optoelectronics Progress, 2016, 53(7): 071405.

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