光谱学与光谱分析, 2016, 36 (7): 2279, 网络出版: 2016-12-23
基于残差分布度量的M矮星细分类研究
Research on M Dwarf Sub-Classification Based on the Measurement of Residual Distribution
基本信息
DOI: | 10.3964/j.issn.1000-0593(2016)07-2279-05 |
中图分类号: | P145.4 |
栏目: | |
项目基金: | 国家自然科学基金项目(U1431102, 11473019)资助 |
收稿日期: | 2015-05-18 |
修改稿日期: | 2015-09-24 |
网络出版日期: | 2016-12-23 |
通讯作者: | |
备注: | -- |
康超, 潘景昌, 衣振萍, 韦鹏, 姜斌. 基于残差分布度量的M矮星细分类研究[J]. 光谱学与光谱分析, 2016, 36(7): 2279. KANG Chao, PAN Jing-chang, YI Zhen-ping, WEI Peng, JIANG Bin. Research on M Dwarf Sub-Classification Based on the Measurement of Residual Distribution[J]. Spectroscopy and Spectral Analysis, 2016, 36(7): 2279.