基于图像对准式V棱镜折射仪低对比度图像的识别算法研究
李延风, 安志勇, 王劲松, 呼丹. 基于图像对准式V棱镜折射仪低对比度图像的识别算法研究[J]. 激光与光电子学进展, 2014, 51(6): 061002.
Li Yanfeng, An Zhiyong, Wang Jinsong, Hu Dan. Algorithm Research on Image Recognition of Low Contrast Single Line in V-Prism Refractometer in Using Image Alignment[J]. Laser & Optoelectronics Progress, 2014, 51(6): 061002.
[1] 李成, 鞠明, 毕笃彦, 等. 基于局部自适应拉升窗的复合图像增强算法[J]. 光学学报, 2009, 29(10): 2756-2761.
[2] 叶露. 光电跟踪仪低对比度目标捕获能力检验方法研究[J].光学学报, 2012, 32(11): 1115001.
[3] 霍金明, 沈湘衡, 叶露, 等. 光电跟踪设备低对比度动态目标捕获能力的检验[J]. 光学学报, 2013, 33(5): 0512004.
[4] 郭裕兰, 鲁敏, 谭志国, 等. 采用投影轮廓特征的激光雷达快速目标识别[J].中国激光, 2012, 39(2): 0209003.
[5] 聂守平, 王鸣, 刘峰. 低对比度图像分割算法研究[J]. 中国激光, 2004, 31(1): 89-91.
[6] Liu J W, Liao W Q, Gui H, et al.. Exploration of the construction of online courses in engineering training education [C]. Proceeding of the 9th International Conference on Modern Industrial Training, 2009, 10: 202-205.
[7] 王栋, 朱明. 低对比度图像中改进的二维熵阈值分割法[J]. 仪器仪表学报, 2004, 25(4): 355-358.
Wang Dong, Zhu Ming. Improved 2D entropy thresholding method in low contrast image [J]. Chinese J Scienific Instrument, 2004, 25(z3): 355-358.
[8] T Wei, Y Han, Y Li, et al.. Temperature- insensitive miniaturized fiber inline Fabry- Perot interferometer for highly sensitive refractive index measurement [J]. Opt Express, 2008, 16(8): 5764-5769.
[9] 李锡善, 孙保定, 孙晶矾, 等. 自动V 棱镜折射仪[ J ].仪器仪表学报, 1992, 13(2): 113-120.
Li Xishan, Sun Baoding, Sun Jingfan, et al.. Automatic refractometer V prism [J]. Chinese J Scientific Instrument, 1992, 13(2): 113-120.
[10] 国家质量监督检验检疫总局. JJG863-2005,V 棱镜折射仪检定规程[S]. 北京: 中国计量出版社, 2005.
General Administration of Quality Supervision, Inspection and Quarantine of the P.R.C.. JJG863- 2005, Nerification Regulation for V Prism Refractometer [S]. Beijing: China Metrology Publishing House, 2005.
李延风, 安志勇, 王劲松, 呼丹. 基于图像对准式V棱镜折射仪低对比度图像的识别算法研究[J]. 激光与光电子学进展, 2014, 51(6): 061002. Li Yanfeng, An Zhiyong, Wang Jinsong, Hu Dan. Algorithm Research on Image Recognition of Low Contrast Single Line in V-Prism Refractometer in Using Image Alignment[J]. Laser & Optoelectronics Progress, 2014, 51(6): 061002.