[1] Wu Y, Yue H, Li M, et al. Dynamic specular surface measurement based on color-encoded fringe reflection technique［J］. Optical Engineering, 2016, 55(2): 0241041-0241047.

[2] Tang Y, Su X, Liu Y, et al. 3D shape measurement of the aspheric mirror by advanced phase measuring deflectometry［J］. Optics Express, 2008, 16(19): 15090-15096.

[3] Hausler G, Faber C, Leitz K and Knauer M. Microdeflectometry-a novel tool to acquire three-dimensional microtopagraphy with nanometer height resolution［J］. Optics Letters, 2008, 30(4): 396-398.

[4] Knauer M C,Kaminski J,Hausler G. Phase measuring deflectometry: a new approach to measure specu-lar free-form surfaces［C］. USA: SPIE, 2004.

[5] Huang L, Xue J, Gao B, et al. Modal phase measuring deflectometry［J］. Optics Express, 2016, 24(21): 24649-24664.

[6] Huang L, Chi S, Asundi A. Fast full-field out-of-plane deformation measurement using fringe reflectometry［J］. Optics & Lasers in Engineering, 2012, 50(4): 529-533.

[7] Li W,Sandner M,Gesierich A, et al. Absolute optical surface measurement with deflectometry［C］. USA: SPIE,2012.

[8] Schmit J, Creath K. Extended averaging technique for derivation of error-compensating algorithms in phase-shifting interferometry［J］. Applied Optics, 1995, 34(19): 3610-3619.

[9] Chen Y, Lin P, Lee C, et al. Iterative phase-shifting algorithm immune to random phase shifts and tilts［J］. Applied Optics, 2013, 52(14): 3381-3386.

[10] Huntley J. Noise-immune phase unwrapping algorithm［J］.Applied Optics,1989,28(16): 3268-3270.

[11] Huang L, Asundi A. Improvement of least-squares integration method with iterative compensations in fringe reflectometry［J］. Applied Optics, 2012, 51(31): 7459-7465.