[1] 温熙森, 邱静, 刘冠军. 装备可测性设计与评估技术综述［J］. 国防科技, 2009, 30(1):1-5. (WEN X S, QIU J, LIU G J. A review of equipment design for testability and assessment technology［J］. National Defense Science & Technology, 2009, 30(1):1-5. )

[2] 石君友, 纪超, 李海伟. 测试性验证技术与应用现状分析［J］. 测控技术, 2012, 31(5):29-32. (SHI J Y, JI C, LI H W. Analysis of testability verification technology and application status［J］. Measurement & Control Technology, 2012, 31(5):29-32. )

[3] 张勇, 邱静, 刘冠军, 等. 面向测试性虚拟验证的功能-故障-行为-测试-环境一体化模型［J］. 航空学报, 2012, 33(2):273-286. (ZHANG Y, QIU J, LIU G J, et al. Integrated function-fault-behavior-test-environment model for virtual testability verification ［J］. Acta Aeronautica et Astronautica Sinica, 2012, 33(2):273-286. )

[4] 田仲. 测试性验证方法研究［J］. 航空学报, 1995, 16:65-70. (TIAN Z. Study of testability demonstration me-thods［J］. Acta Aeronautica et Astronautica Sinica, 1995, 16:65-70. )

[5] 周玉芬, 徐松涛, 高锡俊, 等. 测试性验证的理论和方法研究［J］. 电子产品可靠性与环境试验, 1998(2):10-15. (ZHOU Y F, XU S T, GAO X J, et al. The theory and method in testability demonstration test［J］. Electro-nic Product Reliability and Environmental Testing, 1998 (2):10-15. )

[6] 徐忠伟, 周玉芬, 徐松涛, 等. 测试性验证中抽样方案的精确算法及应用［J］. 航空学报, 2000, 21(1):67-69. (XU Z W, ZHOU Y F, XU S T, et al. Accurate algorithm of sampling plan & its application in testability demonstration［J］. Acta Aeronautica et Astronautica Sinica, 2000, 21(1):67-69. )

[7] 石君友, 田仲. 机内测试定量要求的现场试验验证方法研究［J］. 航空学报, 2006, 27(5):883-887. (SHI J Y, TIAN Z. Study on field demonstration method for quantitative built-in test requirements ［J］. Acta Aeronautica et Astronautica Sinica, 2006, 27(5):883-887. )

[8] OTTAVI M. Evaluating the yield of repairable SRAMs for ATE［J］. IEEE Transactions on Instrumentation and Mea-surement, 2006, 55(10):1704-1712.

[9] 石君友, 田仲. 测试性研制阶段数据评估验证方法［J］. 航空学报, 2009, 30(5):901-905. (SHI J Y, TIAN Z. Testability verification method based on data evaluation in development phase［J］. Acta Aeronautica et Astronautica Sinica, 2009, 30(5):901-905. )

[10] 何洋, 李洪涛, 王志新. 基于多因子的机电设备测试性验证样本分配方案［J］. 电光与控制, 2015, 22(1):97-100. (HE Y, LI H T, WANG Z X. A multi-factor based sample allocation scheme for testability verification of electro-mechanical equipment［J］. Electronics Optics & Control, 2015, 22(1):97-100. )

[11] 田仲, 石君友. 系统测试性设计分析与验证［M］. 北京:北京航空航天大学出版社, 2003:28-40. (TIAN Z, SHI J Y. Testability analysis and verification of the system［M］. Beijing:Beijing Aeronautics and Astronautics University Press, 2003:28-40. )

[12] 中国人民解放军总装备部. GJB 2547-1995装备测试性大纲［S］. 北京:总装备部军标出版发行部, 1995. (General Armament Department of PLA. GJB 2547-1995 testability program for materiel［S］. Beijing:Military Stan-dard Publication Dep of GAD, 1995. )