Chinese Journal of Lasers B, 2002, 11 (2): 111, 网络出版: 2006-08-08
Resolution of Internal Total Reflection Scanning Near-field Optical Microscopy
Resolution of Internal Total Reflection Scanning Near-field Optical Microscopy
scanning near field optical microscopy(SNOM) resolution offset of far-field component to near-field compo
摘要
Abstract
In this paper, the probe-sample interaction equation based on Mie′s scattering theory is derived, and the resolution of scanning near field optical microscopy is calculated numerically. The results show that the offset of far-field component to near-field component in total field plays an important role in the resolution and the size of samples also has influence on resolution.
GE Huayong, GUO Qizhi, TAN Weihan. Resolution of Internal Total Reflection Scanning Near-field Optical Microscopy[J]. Chinese Journal of Lasers B, 2002, 11(2): 111. GE Huayong, GUO Qizhi, TAN Weihan. Resolution of Internal Total Reflection Scanning Near-field Optical Microscopy[J]. 中国激光(英文版), 2002, 11(2): 111.