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Variational denoising method for electronic speckle pattern interferometry

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Abstract

Traditional speckle fringe patterns by electronic speckle pattern interferometry (ESPI) are inherently noisy and of limited visibility, so denoising is the key problem in ESPI. We present the variational denoising method for ESPI. This method transforms the image denosing to minimizing an appropriate penalized energy function and solving a partial differential equation. We test the proposed method on computer-simulated and experimental speckle correlation fringes, respectively. The results show that this technique is capable of significantly improving the quality of fringe patterns. It works well as a pre-processing for the fringe patterns by ESPI.

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收稿日期:2007-07-16

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张芳:College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin 3000722Key Laboratory of Opto-Electronics Information Technical Science, Ministry of Education, Tianjin University, Tianjin 3000723Department of Applied Physics, Tianjin University, Tianjin 300072
刘文耀:College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin 3000722Key Laboratory of Opto-Electronics Information Technical Science, Ministry of Education, Tianjin University, Tianjin 3000723Department of Applied Physics, Tianjin University, Tianjin 300072
唐晨
王晋疆:College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin 3000722Key Laboratory of Opto-Electronics Information Technical Science, Ministry of Education, Tianjin University, Tianjin 3000723Department of Applied Physics, Tianjin University, Tianjin 300072
任丽:College of Precise Instrument and Optical Electronic Engineering, Tianjin University, Tianjin 3000722Key Laboratory of Opto-Electronics Information Technical Science, Ministry of Education, Tianjin University, Tianjin 3000723Department of Applied Physics, Tianjin University, Tianjin 300072

备注:F. Zhang’s e-mail address is hhzhangfang@126.com.

【1】M. J. Huang, Z.-N. He, and F.-Z. Lee, Measurement 36, 93 (2004).

【2】C. Quan, C. J. Tay, F. Yang, and X. He, Appl. Opt. 44, 4814 (2005).

【3】R. Ambu, F. Aymerich, F. Ginesu, and P. Priolo, Compos. Sci. Technol. 66, 199 (2006).

【4】N. A. Ochoa, F. M. Santoyo, A. J. Moore, and C. P. López, Appl. Opt. 36, 2783 (1997).

【5】K. H. Womack, Opt. Eng. 23, 391 (1984).

【6】P. Sun, L. Zhang, and C. Tao, Acta Photon. Sin. (in Chinese) 34, 1074 (2005).

【7】P. Perona and J. Malik, IEEE Trans. Pattern Analysis and Machine Intelligence 12, 629 (1990).

【8】F. Catté, P.-L. Lions, J.-M. Morel, and T. Coll, SIAM J. Numer. Anal. 29, 182 (1992).

【9】Y. Chen, C. A. Z. Barcelos, and B. A. Mair, Comput. Vis. Image Understand. 82, 85 (2001).

【10】W. Qian, R. Liu, W. Wang, S. Qi, W. Wang, and J. Cheng, Journal of Image and Graphics (in Chinese) 11, 818 (2006).

【11】C. Tang, F. Zhang, H. Yan, and Z. Chen, Opt. Commun. 260, 91 (2006).

【12】L. I. Rudin, S. Osher, and E. Fatemi, Phys. D 60, 259 (1992).

【13】S. L. Keeling, Appl. Math. Comput. 139, 101 (2003).

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