半导体光子学与技术, 2010, 16 (4): 132, 网络出版: 2011-07-27  

Effect of Duty Cycle on Properties of Pulse-electro-deposited SnS:Ag Thin Films

Effect of Duty Cycle on Properties of Pulse-electro-deposited SnS:Ag Thin Films
作者单位
1 College of Physics and Information Engineering, Institute of Micro-Nano Devices & Solar Cells, Fuzhou University, Fuzhou 350108, CHN
2 Key Laboratory of Analysis and Detection Technology for Food Safety of the Ministry of Education, Department of Chemistry, Fuzhou University, Fuzhou 350108, CHN
摘要
Abstract
SnS:Ag thin films were deposited on ITO glasses by pulse electro-deposition. By studying the effect of duty cycle on the properties of SnS:Ag thin films, the optimum off-time( toff) is obtained to be 5 s, namely, the optimal duty cycle is about 67 %. The primary phase of SnS:Ag films deposited on optimum parameters condition is SnS compound with good crystallization, and the films prefer to grow towards (111) plane. The films are dense, smooth and uniform with good microstructure, and the grains in the films are densely packed together, and their direct bandgap is about 1. 40 eV. In addition, the bandgap of the films first rises and then drops with the increase of the duty cycle.

LU Peimin, JIA Hongjie, YANG Yongli, CHENG Shuying. Effect of Duty Cycle on Properties of Pulse-electro-deposited SnS:Ag Thin Films[J]. 半导体光子学与技术, 2010, 16(4): 132. LU Peimin, JIA Hongjie, YANG Yongli, CHENG Shuying. Effect of Duty Cycle on Properties of Pulse-electro-deposited SnS:Ag Thin Films[J]. Semiconductor Photonics and Technology, 2010, 16(4): 132.

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