Chinese Optics Letters, 2017, 15 (3): 030004, Published Online: Jul. 25, 2018  

Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper) Download: 670次

Author Affiliations
1 GIPYS Laboratory, Centro de Investigaciones en Óptica, A. C., León, Gto 37150, México
2 Department of Electro-Optics and Photonics, University of Dayton, Dayton, OH 45469, USA
Abstract
In this Letter, a refractive index measurement of a dielectric sample using highly focused radially polarized light is reported. Through imaging analysis of the optical field at the pupil plane of a high numerical aperture (NA) objective lens reflected by the sample under study, the Brewster angle is found. Employing a high NA objective lens allows the measurement of multiple angles of incidence from 0° to 64° in a single shot. The refractive index of the sample is estimated using the measured Brewster angle. The experimental results are compared with the theoretical images computed with the Fresnel theory, and a good agreement is obtained.

Guadalupe López-Morales, Victor-Manuel Rico-Botero, Rafael Espinosa-Luna, Qiwen Zhan. Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)[J]. Chinese Optics Letters, 2017, 15(3): 030004.

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