光学学报, 2017, 37 (3): 0318004, 网络出版: 2017-03-08
超分辨定位成像中的像差表征和校正 下载: 1254次
Aberration Characterization and Correction in Super-Resolution Localization Microscopy
显微 荧光显微镜 超分辨成像 像差校正 分辨率 定位精度 microscopy fluorescence microscopy super-resolution imaging aberration correction resolution localization precision
摘要
超分辨定位成像技术凭借对数千甚至数万张采集的原始图像进行单分子定位及重建, 可以获得几十纳米的超高分辨率, 观察到之前看不到的细胞结构以及生物现象。然而, 在实际的成像过程中, 采集到的图像会受到像差(来源于光学系统的不完美或样品本身的不均匀性)的影响而导致分辨率下降, 甚至会造成错误结果。为此, 定量表征了几种典型像差对超分辨定位成像的影响, 并提出了一种基于样品图像本身的像差校正方法。仿真和实验结果表明, 像差会造成系统点扩展函数的变形以及成像分辨率的下降, 使用基于图像本身的像差校正方法可以恢复图像的成像质量。
Abstract
Super-resolution localization microscopy can achieve the ultra-high spatial resolution up to several nanometers by the single molecule localization and reconstruction from thousands or even tens of thousands of single molecule image, which provides unprecedented opportunities for studying the cell structures and biological phenomenon. However, the aberration (originating from the imperfection of the optical system or the inhomogeneity of the sample itself) distorts the raw images from single molecules, which decreases the final spatial resolution and even results in wrong results. The effects of several representative aberrations on super-resolution localization imaging are quantitatively characterized, and an aberration correction method based on the sample image itself is proposed. Simulation and experimental results show that the aberrations cause distortion of the point spread function and the decrease of the spatial resolution. The image quality can be restored by using the proposed aberration correction method.
赵泽宇, 张肇宁, 黄振立. 超分辨定位成像中的像差表征和校正[J]. 光学学报, 2017, 37(3): 0318004. Zhao Zeyu, Zhang Zhaoning, Huang Zhenli. Aberration Characterization and Correction in Super-Resolution Localization Microscopy[J]. Acta Optica Sinica, 2017, 37(3): 0318004.