目前京东方部分产品量产时易出现重力Mura、低温气泡等问题, 本文针对问题产生的原因进行分析, 并对PS高度测试方法、PS高度与液晶量的联动方法进行分析研究及实验验证。目前测试PS高度的方法并未考虑工艺波动造成的色阻段差的变化对盒内体积的影响, 本文首先提出了可以反映量产时色阻变化的PS高度测量方法, 另根据LC Margin评价结果及PS 形变量结果给出了PS高度与液晶量的联动关系。通过对PS高度与液晶量联动的分析研究, 有效解决了因量产工艺波动造成的PS偏差引起的实际量产时滴下的液晶量并非对应的LC Margin中心的问题, 从而避免出现重力Mura和低温气泡等LC Margin相关的问题, 并且扩大了3%的工程管控范围, 为企业的产品品质和竞争力的提升奠定了良好的基础。

At present, some of the BOE products always had the problems of gravity Mura and cold 气泡. In this paper, the causes of these problems were analyzed. Also, the method of PS height measurement, the interaction relation between PS height and the amount of liquid crystal were analyzed and experimentally verified. We found that the current method of PS height measurement didn’t consider the influence of RGB process variation. In this paper, the influence of RGB process variation was considered in the new measurement method of PS height.At the same time, the linkage between PS height and LC amount was proposed based on the evaluation result of LC Margin and the PS deformation result. We solved the problem that the LC amount during the process of actual mass production was different from the center of appropriate LC Margin. In this way, the problems such as gravity Mura and cold bubble were avoided. Also, the margin of process control had been expanded 3%.