为实现材料在冲击加载下微观动力学响应测量, 基于小型闪光X射线源开展衍射成像系统设计.利用直流X光机及高纯锗探测器实现系统衍射光路的精确调节, 克服了闪光X射线瞬时强度高及连续辐射本底强导致的衍射角度确定困难, 并采用Scandiflash AB公司TD-450S和成像板建立了衍射成像系统.应用该系统在冲击加载实验中获得了LiF单晶单脉冲的Mo-Kα线静态及动态衍射图像.该闪光X射线衍射系统时间分辨率可达25 ns, 为冲击压缩实验中材料瞬时结构变化测量提供了新的实验方法.

Flash X-ray diffraction imaging system based on flash X-ray generator (TD-450S of Scandiflash AB) and imaging plate was designed to measure microscopic response in shock wave compression studies. Due to intense Bremsstrahlung radiation, continuous X-ray generator and HPGe detector were used to regulate diffraction optical path. Diffraction signal of LiF single crystal was recorded using flash X-ray tube with molybdenum as the anode material under ambient conditions and shocked state. Results show that flash X-ray diffraction imaging system described here is useful for examining structural changes in shock compression experiments and temporal resolution is 25 ns.