光子学报, 2018, 47 (3): 0314003, 网络出版: 2018-02-01
基于SiO2薄膜的915 nm半导体激光器的无杂质空位诱导量子阱混合研究
Impurity-free Vacancy Diffusion Induces Quantum Well Intermixing in 915 nm Semiconductor Laser Based on SiO2 Film
半导体激光器 光学灾变 量子阱混杂 非吸收窗口 薄膜 Semiconductor laser Catastrophic optical damage Quantum well intermixing Non-absorbing window Film
摘要
为了提高915 nm半导体激光器腔面抗光学灾变的能力, 采用基于SiO2薄膜无杂质诱导量子阱混合法制备符合915 nm半导体激光器AlGaInAs单量子阱的非吸收窗口.研究了无杂质空位诱导量子阱混合理论及不同退火温度、不同退火时间、SiO2薄膜厚度、SiO2薄膜折射率、不同盖片等试验参数对制备非吸窗口的影响, 并且讨论了SiO2薄膜介质膜的多孔性对无杂质诱导量子阱混合的影响.实验制备出蓝移波长为53 nm的非吸收窗口, 最佳制备非吸收窗口条件为退火温度为875℃, 退火时间为90s, SiO2薄膜折射率为1.447, 厚度为200 nm, 使用GaAs盖片.
Abstract
The non-absorbing window is adopted in the 915nm semiconductor laser to improve the catastrophic optical damage level of the device. The non-absorbing window is fabricated by impurity free vacancy diffusion induces quantum well intermixing based on SiO2 thin film technology. The theory of the impurity free vacancy diffusion induces quantum well intermixing will be systematic researching. And the different experimental conditions such as the annealing temperature, the thickness of SiO2 thin film, the refractive index of SiO2 film and the cover gaps are evaluated in the paper. And the mechanism is discussed for the effect of the porosity SiO2 film dielectric film in the impurity free vacancy diffusion induces quantum well intermixing. Ultimately the experiment results show that a luminescence blue shift 53 nm is obtained from the sample The optimal experimental conditions are annealing at 875℃ for 90s, and the thickness of the SiO2 thin film is 200 nm with the refractive index is 1.447, choosing GaAs cap piece to be the cover gap.
王鑫, 赵懿昊, 朱凌妮, 侯继达, 马骁宇, 刘素平. 基于SiO2薄膜的915 nm半导体激光器的无杂质空位诱导量子阱混合研究[J]. 光子学报, 2018, 47(3): 0314003. WANG Xin, ZHAO Yi-hao, ZHU Ling-ni, HOU Ji-da, MA Xiao-yu, LIU Su-ping. Impurity-free Vacancy Diffusion Induces Quantum Well Intermixing in 915 nm Semiconductor Laser Based on SiO2 Film[J]. ACTA PHOTONICA SINICA, 2018, 47(3): 0314003.