半导体光电, 2018, 39 (2): 239, 网络出版: 2018-05-29  

宽谱光源平均波长测试系统光路设计仿真

Simulation on Optical Design of Average Wavelength Test System with Broad Spectrum Light Source
作者单位
北京航空航天大学 仪器科学与光电工程学院, 北京 100191
摘要
利用像元分辨率公式和高斯光束传输理论, 设计了一种基于线阵InGaAs光电探测器的宽谱光源平均波长测试系统光路结构。在Zemax光学软件中建立了宽谱光源平均波长测试系统的光路模型, 并优化了该测试系统的光路结构参数。根据软件仿真建立的光路模型, 分析了位置偏差对准直光束平行度及系统光能利用率的影响, 得到了相应的变化曲线, 为宽谱光源平均波长测试系统的结构设计和装配提供了指导。
Abstract
Based on the pixel resolution formula and the Gaussian beam transmission theory, an optical structure of test system based on linear array InGaAs photodetector was designed to test the average wavelength of broad spectrum light source. The optical structure model was established in the Zemax optical software, and the optical structure parameters of the test system were optimized. According to the established ptical model, the influence of position deviation on the beam collimation and the system energy efficiency was analyzed. Corresponding curve was obtained, providing a guidance for the design and assembly of the average wavelength test system of broad spectrum light source.

徐宏杰, 刘志强, 黄东升. 宽谱光源平均波长测试系统光路设计仿真[J]. 半导体光电, 2018, 39(2): 239. XU Hongjie, LIU Zhiqiang, HUANG Dongsheng. Simulation on Optical Design of Average Wavelength Test System with Broad Spectrum Light Source[J]. Semiconductor Optoelectronics, 2018, 39(2): 239.

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