液晶与显示, 2019, 34 (11): 1073, 网络出版: 2019-12-10   

摩擦工艺不良的探究

Research and solution of defects in rubbing process
作者单位
1 重庆京东方光电科技有限公司, 重庆 400714
2 重庆人文科技学院, 重庆 401120
摘要
TFT-LCD的摩擦工艺中, 容易产生摩擦Mura、L0 条形不均、摩擦划伤等不良。分析及验证发现: 摩擦Mura的发生与摩擦强度较弱, 聚酰亚胺膜配向力不足引起像素漏光相关。选择摩擦强度好的尼龙布, 并控制摩擦布寿命在100张基板以下, 可以有效控制不良的发生。通过工艺调整加强摩擦强度时需考虑Zara发生情况, 选择摩擦Mura和Zara总体发生较低的摩擦强度是必要的。采用摩擦辊垂直基板短边设计, 可一定程度控制摩擦Mura的发生; 长条型像素设计可从源头防止漏光产生。产品设计时避免显示区延伸区域大块金属的干涉可一定程度防止条形不均发生, 以信号层作为绑定IC引线较之开关层做引线对条形不均改善有更好的效果。棉布的棉籽剪裁、摩擦设备机台的及时有效清洁、基板来料的超声波清洗是防止摩擦划伤发生的有效保证。
Abstract
In TFT-LCD industry, in the rubbing process, some defect like rubbing Mura, L0 block, rubbing scratch are easy to happen. Investigation and experiment found that the rubbing Mura is associated with weak Rubbing strength and weak coordination force of polyimide film, which results in pixel light leakage. Choosing the nylon cloth with good rubbing strength, and controling cloth life under 100 sheets, can effectively control the occurrence of rubbing Mura. Improving rubbing strength through craft adjustment, Zara needs to be taken into account, normally should choose a proper strength that can keep rubbing Mura and Zara with a lower ratio. Making the rubbing roller direction perpendicular to short side of glass substrate is beneficial to reduce the incidence of rubbing Mura, and strip type pixel design can prevent light-leaking from its source. Some block can be prevented by avoiding the interference of large metal in the extended area of display area. Using signal layer as binding IC lead has better effect on block improvement than using switch layer as lead. The cutting of cotton seeds,timely and effectively cleaning of rubbing equipment, ultrasonic cleaning of glass substrate are some effective measures to prevent rubbing scratch occuring.

杨宗顺, 杨夏梅, 熊奇, 王耀杰, 钟野, 熊永. 摩擦工艺不良的探究[J]. 液晶与显示, 2019, 34(11): 1073. YANG Zong-shun, YANG Xia-mei, XIONG Qi, WANG Yao-jie, ZHONG Ye, XIONG Yong. Research and solution of defects in rubbing process[J]. Chinese Journal of Liquid Crystals and Displays, 2019, 34(11): 1073.

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