红外与毫米波学报, 2020, 39 (6): 690, 网络出版: 2021-01-20   

分子束外延碲镉汞薄膜“燕尾”状缺陷

The ‘swallow-tailed defect’ in MBE HgCdTe film
作者单位
昆明物理研究所,云南昆明 650223
摘要
“燕尾”状缺陷是异质外延碲镉汞薄膜中一种形状、朝向统一的典型缺陷,本文对“燕尾”状缺陷的表面形貌、结构及形成机理进行了表征及研究。结果表明,在碲镉汞薄膜表面,“燕尾”状缺陷以两条凸起的“燕尾”边为特征形貌。在碲镉汞薄膜中,“燕尾”状缺陷为倒金字塔结构,由(11ˉ1ˉ) 1ˉ1ˉ1 (11ˉ1)(111ˉ) 四个底面与(211)表面围成。“燕尾”状缺陷为(552)A孪晶缺陷,(552)A孪晶与(211)A基体间不同的生长速率导致了缺陷的形成。碲镉汞晶体中12个滑移系统间不同的Schmid因子决定了(552)A孪晶成核生长于1ˉ1ˉ1 (11ˉ1)面,也决定了“燕尾”状缺陷的表面形貌及结构。
Abstract
The swallow-tailed defect is a typical defect in MBE HgCdTe which has a uniform and regular shape. The morphology, structure and growth mechanism of swallow-tailed defect were investigated. Two raised swallow-tails are major characteristic on the surface, and an inverted pyramid structure surrounded by (11ˉ1ˉ)1ˉ1ˉ1(11ˉ1)(111ˉ) and (211) crystal faces is demonstrated in the film of the defect. The swallow-tailed defect is (552)A twin defect, the difference of growth rate between (552)A twin crystal and (211)A matrix is the root cause of defect formation. The nucleation sites and growth planes of (552)A twin crystal, 1ˉ1ˉ1 and (11ˉ1) crystal plane, which determines the morphology and structure of swallow-tailed defect, depend on different Schmid factor of 12 slip systems in HgCdTe.

杨晋, 孔金丞, 俞见云, 李艳辉, 杨春章, 覃钢, 李东升, 雷文, 赵俊, 姬荣斌. 分子束外延碲镉汞薄膜“燕尾”状缺陷[J]. 红外与毫米波学报, 2020, 39(6): 690. Jin YANG, Jin-Cheng KONG, Jian-Yun YU, Yan-Hui LI, Chun-Zhang YANG, Gang QIN, Dong-Sheng LI, Wen LEI, Jun ZHAO, Rong-Bin JI. The ‘swallow-tailed defect’ in MBE HgCdTe film[J]. Journal of Infrared and Millimeter Waves, 2020, 39(6): 690.

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