强电磁脉冲普遍存在于高能激光、X光装置和未来战场等环境中,这种恶劣的环境会对电子学设备,尤其是承载特定任务而无法增加屏蔽手段的光学成像设备造成严重威胁。选用数码相机和分立的电荷耦合器件(CCD)摄像系统作为典型的效应物,开展了光学成像设备在不同强电磁脉冲环境下的效应实验研究。通过实验观察到了成像设备功能异常、成像质量下降甚至端口部件烧毁等效应。对实验中观察到的效应及其发生的电磁场环境数据进行总结分析,提出了应用于特定环境阈值下设备的失效概率,即概率阈值的概念来衡量设备在恶劣环境下的生存状态的观点,并给出了CCD成像系统的概率阈值曲线,最后对此类型实验的开展和效应数据处理方法进行了探讨。本研究结果能为成像设备在强电磁环境下的状态评估及防护技术研究提供数据支撑和参考依据。

Intensive electromagnetic pulses are common in high-power laser and X-ray equipment and in various environments, such as future battlefields. This kind of harsh environmental factor can affect electronic equipment, especially optical-imaging devices that cannot be shielded well while performing specific imaging tasks. Herein, we choose a digital camera and discrete charge coupled device (CCD) camera system as typical devices used for testing. We investigate the effects on optical-imaging device when the device is subjected to an intensive electromagnetic environment. We observe such effects as equipment malfunctions, decline in imaging quality, and module destruction. Herein, the observed effects and relevant electromagnetic environment data are summarized and analyzed. We promote the idea of using failure-probability thresholds under certain environmental conditions to measure the equipment viability. We provide the probability threshold curve for the CCD imaging system. Finally, we discuss the experimental method to investigate the electromagnetic effects. This work can provide supporting data and referable experience for others’ evaluation and protection of equipment subjected to intensive electromagnetic environment.