Chinese Optics Letters, 2019, 17 (12): 121103, Published Online: Dec. 3, 2019  

Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging Download: 943次

Author Affiliations
Institute of Modern Optics, Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Nankai University, Tianjin 300350, China
Abstract
Subtractive imaging is used to suppress the axial sidelobes and improve the axial resolution of 4pi microscopy with a higher-order radially polarized (RP) Laguerre–Gaussian (LG) beam. A solid-shaped point spread function (PSF) and a doughnut-shaped PSF with a dark spot along the optical axis are generated by tightly focusing a higher-order RP-LG beam and a modulated circularly polarized beam, respectively. By subtracting the two images obtained with those two different PSFs, the axial sidelobes of the subtracted PSF are reduced from 37% to about 10% of the main lobe, and the axial resolution is increased from 0.21λ to 0.15λ.

Zhiyuan Gu, Xianghui Wang, Jianxin Wang, Fei Fan, Shengjiang Chang. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging[J]. Chinese Optics Letters, 2019, 17(12): 121103.

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