会议名称(中文): 2018年SPIE陡峭色散工程与光原子精密测量会议
会议名称(英文): SPIE Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
所属学科: 光电子学,仪器仪表与装置
开始日期: 2018-01-29
结束日期: 2018-02-01
所在国家: 美国
所在城市: 美国
具体地点: San Francisco, California, United States
主办单位: 国际光学工程学会
会议网站: http://spie.org/PWO/conferencedetails/steep-dispersion-engineering-opto-atomic-precision-metrology 

会议背景介绍:

Conference Sessions OPTO Plenary Session 1: Photonic Crystals 2: New Developments in Slow and Fast Light 3: Steep Dispersion-based Sensing 4: Optical Computing, Delay Lines, and Storage 5: Tutorial 6: Plasmonics 7: Nanophotonic Devices 8: Nonlinear Effects for Steep Dispersion 9: Fast Light, Non-Reciprocity, PT Symmetry, and Related Topics 10: Quantum Control Spin Squeezing and Related Technologies 11: Atomic Clocks, Atomic Interferometers, and Enabling Technologies 12: Integrated and Nanotechnology for Precision Metrology and Dispersion Engineering Posters-Wednesday 13: Quantum Technologies for Precision Metrology and Sensing 14: New Developments in Precision Metrology 15: Atom Interferometry

来源:SPIE