为研究高功率微波与复杂系统的耦合问题,提出了随机拓扑方法。该方法是一种新的系统级电磁敏感度分析预测方法,它结合电磁拓扑理论和随机耦合模型理论,可对包含多个腔体的复杂系统的短波电磁耦合问题进行统计分析。介绍了随机拓扑方法的理论基础,并利用计算机机箱搭建了双腔体和多腔体实验平台。使用该方法对目标位置处感应电压的统计分布进行了预测,并与其他方法得到的感应电压分布进行了比较,其结果基本一致,从而证明了该方法的可行性和准确性。

The coupling of high power microwave into electrical systems, such as airplane, cars, ships, is very complicated. Furthermore, if the incoming wavelength is much smaller compared to enclosure size of target system, the coupling properties of the system depend on its size and shape, the geometry of apertures, and the frequency of the incoming wave. In the short wavelength limit, the nature of the inside electromagnetic field is extremely sensitive to subtle changes in frequency, the shape of the enclosure, and the orientation of the internal devices or cables. At present, even with the fast and powerful computers that utilize efficient 3-D numerical analysis code, addressing this problem is a great challenge because of the numerous CPU resources and computational time. Thus, statistical electromagnetic methods are more appropriate.The stochastic topology approach is a novel statistical method for analyzing system level electromagnetic effects, which combines the BLT topology theory and the random coupling model. This method is able to predict the statistical distribution of induced voltages or currents on components within a system that consists of multiple cavities when excited by short-wavelength interference, such as high power microwave (HPM). Thereby, the probability that the components be disturbed or damaged will be predicted with the threshold data. The general theoretical approach is introduced, and our work on experiments to verify the feasibility and accuracy of this method is presented.