Sidelobe suppression in light-sheet fluorescence microscopy with Bessel beam plane illumination using subtractive imaging

Suhui Deng; Yiping Xiao; Jie Hu; Jianfang Chen; Yuhao Wang; Mingping Liu

doi:doi:10.3788/COL201816.111801

Chinese Optics Letters, 2018, 16 (11): 111801, Published Online: Nov. 11, 2018

Sidelobe suppression in light-sheet fluorescence microscopy with Bessel beam plane illumination using subtractive imaging Download： 737次

Suhui Deng ^1,2Yiping Xiao ¹Jie Hu ¹Jianfang Chen ³Yuhao Wang ¹Mingping Liu ^1,*

Author Affiliations

¹ School of Information Engineering, Nanchang University, Nanchang 330031, China

² Division of Physical Biology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China

³ Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

Figures & Tables

Fig. 1. Schematic diagram of the optical system of a subtractive Bessel LSFM.

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Fig. 2. Calculated intensity distributions of (a), (c) the extended Bessel light-sheet beam and (b), (d) the ring-like Bessel light-sheet beam (a), (b) in the y–z plane with x=0 and (c), (d) in the x–z plane with y=0 . (e) The normalized line profiles of the intensity distributions along the central z axis in (c) and (d).

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Fig. 3. PSFs of the light-sheet microscopy in the y–z plane. (a) The calculated illumination PSF for the conventional Bessel LSFM with an annular mask characterized by NAmax=0.7 and NAmin=0.68. (b) The detection PSF with NAdet=0.7. (c) The system PSF for the conventional Bessel LSFM. (d) The system PSF for subtractive Bessel LSFM obtained with extended solid Bessel beam with an annular mask characterized by NAmax=0.67 and NAmin=0.65 and a ring-like Bessel beam with an annular mask characterized by NAmax=0.7 and NAmin=0.68. (e) The normalized line profiles of the intensity distributions along the central axis in (c) and (d).

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Fig. 4. Simulated images of a sample consisting of 16 points shown in (a) for (b) the conventional Bessel LSFM and (c) the subtractive Bessel LSFM.

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Fig. 5. Simulated images of a sample consisting of four parallel lines shown in (a) for (b) the conventional Bessel LSFM and (c) the subtractive Bessel LSFM. (d) The central line profiles of the intensity along the z axis in (a), (b), and (c).

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Suhui Deng, Yiping Xiao, Jie Hu, Jianfang Chen, Yuhao Wang, Mingping Liu. Sidelobe suppression in light-sheet fluorescence microscopy with Bessel beam plane illumination using subtractive imaging[J]. Chinese Optics Letters, 2018, 16(11): 111801.

Sidelobe suppression in light-sheet fluorescence microscopy with Bessel beam plane illumination using subtractive imaging Download： 737次

Fig. 1. Schematic diagram of the optical system of a subtractive Bessel LSFM.

Fig. 4. Simulated images of a sample consisting of 16 points shown in (a) for (b) the conventional Bessel LSFM and (c) the subtractive Bessel LSFM.

Fig. 5. Simulated images of a sample consisting of four parallel lines shown in (a) for (b) the conventional Bessel LSFM and (c) the subtractive Bessel LSFM. (d) The central line profiles of the intensity along the z axis in (a), (b), and (c).

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Sidelobe suppression in light-sheet fluorescence microscopy with Bessel beam plane illumination using subtractive imaging Download： 737次

Fig. 1. Schematic diagram of the optical system of a subtractive Bessel LSFM.

Fig. 4. Simulated images of a sample consisting of 16 points shown in (a) for (b) the conventional Bessel LSFM and (c) the subtractive Bessel LSFM.

Fig. 5. Simulated images of a sample consisting of four parallel lines shown in (a) for (b) the conventional Bessel LSFM and (c) the subtractive Bessel LSFM. (d) The central line profiles of the intensity along the z axis in (a), (b), and (c).

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