Erbium-doped TeO2-coated Si3N4 waveguide amplifiers with 5 dB net gain: erratum Download: 519次
1 Department of Engineering Physics, McMaster University, Hamilton, Ontario L8S 4L7, Canada
2 LioniX International BV, Enschede AL 7500, The Netherlands
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Fig. 2. Diagram of the double-side pumping setup used to measure gain on the TeO2:Er3+-coated Si3N4 chips. (b) Image of the chip showing the characteristic green light emission of erbium when pumping the paperclip waveguide.
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Table1. Parameters Used for Rate Equation Model
Parameter | Value | ion concentration | | 970 nm background propagation loss | 2.5 dB/cm | 1470 nm background propagation loss | 0.25 dB/cm | 1558 nm background propagation loss | 0.25 dB/cm | Launched signal power | | Upconversion parameter | | lifetime | 0.48 ms | lifetime | 0.04 ms | 970 nm absorption/emission cross section | | 1470 nm absorption/emission cross section | | 1558 nm absorption/emission cross section | |
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Henry C. Frankis, Hamidu M. Mbonde, Dawson B. Bonneville, Chenglin Zhang, Richard Mateman, Arne Leinse, Jonathan D. B. Bradley. Erbium-doped TeO2-coated Si3N4 waveguide amplifiers with 5 dB net gain: erratum[J]. Photonics Research, 2020, 8(6): 06001022.