基片表面状态对Pb1-xGexTe薄膜红外光学性能的影响
谢平, 李斌, 张素英, 刘定权. 基片表面状态对Pb1-xGexTe薄膜红外光学性能的影响[J]. 红外, 2010, 31(9): 14.
XIE Ping, LI Bin, ZHANG Su-ying, LIU Ding-quan. Influence of Substrate Surface Status on Infrared Optical Characteristics of Pb1-xGexTe Films[J]. INFRARED, 2010, 31(9): 14.
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[3] 张素英, 范滨, 李斌, 等. Pb1-x Ge［Trial mode］Te薄膜的光学性质 ［J］. 红外与毫米波学报, 2001, 20(1): 69-72.
谢平, 李斌, 张素英, 刘定权. 基片表面状态对Pb1-xGexTe薄膜红外光学性能的影响[J]. 红外, 2010, 31(9): 14. XIE Ping, LI Bin, ZHANG Su-ying, LIU Ding-quan. Influence of Substrate Surface Status on Infrared Optical Characteristics of Pb1-xGexTe Films[J]. INFRARED, 2010, 31(9): 14.
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