弹光调制测晶体电光系数的数字锁相实现

在弹光调制测晶体电光系数系统中, 对弹光调制器工作控制和调制信号数据处理进行了优化设计, 并实现一种灵敏度高、测量快速、成本低和系统集成度高的晶体电光系数测量方案.针对弹光调制及调制信号的特点, 采用现场可编程门阵列完成弹光调制器的工作控制和测量数据的提取.现场可编程门阵列提供弹光调制器工作电压信号, 控制模数转换器的采样频率, 同时产生正弦和余弦参考序列来提取直流项、一倍频项的同向分量和正交分量, 并输入计算机中求解得出晶体电光系数.对铌酸锂样品进行了测试, 实验结果表明系统重复度和灵敏度为0.0016×10－12 m/V, 测量速率为1ms/数据点.较其他晶体电光系数测量方法, 本文方法具有更高的测量灵敏度和更快的测量速率, 为实现弹光调制测量晶体电光系数的智能系统奠定了基础.

Abstract

In order to integrate and optimize the manipulation of photoelastic modulator and data processing in the measurement system of crystal electro-optic coefficient by photoelastic modulation, and realize a highly sensitive, fast, low cost and highly integral crystal electro-optic coefficient measurement scheme. According to the characteristics of the photoelastic modulation and modulation signal, a field programmable gate array is used to fulfill the control of the photoelastic modulator and the extraction of measuring data. The field programmable gate array provides the drive signal of the photoelastic modulator and controls the AD sampling simultaneously, and it also produces the cosine and sine reference sequences to achieve the DC term, the co-component and quadrature component of the first term, these terms are input in a computer to solve out the crystal electro-optic coefficient. A lithium niobate sample was tested, the results show that the repeatabilitiy and sensitivity of the system is 0.0016×10－12 m/V, the measurement rate is 1 ms/ data point. Compared to the other crystal electro-optic coefficient measurement methods, the proposed method has higher measurement sensitivity and faster measurement speed, which lays the foundation for the realization of the intelligent system for measuring the the crystal electro-optic coefficient by photoelastic modulation.

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