半导体光电, 2016, 37 (6): 763, 网络出版: 2016-12-30   

光电编码器检测装置研究现状与展望

Current Developing Situation and Trend of Measurement Devices of Photoelectric Encoder
作者单位
1 中国科学院长春光学精密机械与物理研究所, 长春130033
2 中国科学院大学, 北京100049
引用该论文

刘小树, 万秋华, 王树洁, 杨守旺, 孙莹. 光电编码器检测装置研究现状与展望[J]. 半导体光电, 2016, 37(6): 763.

LIU Xiaoshu, WAN Qiuhua, WANG Shujie, YANG Shouwang, SUN Ying. Current Developing Situation and Trend of Measurement Devices of Photoelectric Encoder[J]. Semiconductor Optoelectronics, 2016, 37(6): 763.

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刘小树, 万秋华, 王树洁, 杨守旺, 孙莹. 光电编码器检测装置研究现状与展望[J]. 半导体光电, 2016, 37(6): 763. LIU Xiaoshu, WAN Qiuhua, WANG Shujie, YANG Shouwang, SUN Ying. Current Developing Situation and Trend of Measurement Devices of Photoelectric Encoder[J]. Semiconductor Optoelectronics, 2016, 37(6): 763.

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