Chinese Optics Letters, 2019, 17 (12): 121103, Published Online: Dec. 3, 2019  

Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging Download: 954次

Author Affiliations
Institute of Modern Optics, Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Nankai University, Tianjin 300350, China
Basic Information
DOI: 10.3788/COL201917.121103
中图分类号: --
栏目: Imaging Systems
项目基金: This work was supported by the Key Program of the Natural Science Foundation of Tianjin (No. 19JCZDJC32700) and the Science and Technology Support Program of Tianjin (No. 17YFZCSY00740). This work was partially carried out at the Engineering Research Center of Thin Film Photo-electronics Technology, Ministry of Education.
收稿日期: Jun. 17, 2019
修改稿日期: --
网络出版日期: Dec. 3, 2019
通讯作者: Xianghui Wang (wangxianghui@nankai.edu.cn)
备注: --

Zhiyuan Gu, Xianghui Wang, Jianxin Wang, Fei Fan, Shengjiang Chang. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging[J]. Chinese Optics Letters, 2019, 17(12): 121103.

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