Chinese Optics Letters, 2019, 17 (12): 121103, Published Online: Dec. 3, 2019
Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging Download: 953次
Figures & Tables
Fig. 1. Diagram of 4pi focusing configuration. The lateral and axial directions are denoted by the axis and axis, respectively.
Fig. 2. Calculated PSF profiles (a) in the transverse direction and (b) in the axial direction for the beam, RP beam, circularly polarized beam, and -axis linearly polarized beam, respectively. The peak intensities have been normalized to one.
Fig. 3. 2D intensity distributions of the (a) and (b) in the plane ( ). Axial profiles of the for different values of (c) NA and (d) , respectively. (e) Axial profiles of the (red dashed line), (green dotted line), and (blue solid line) in the axis. (f) Intensity distribution of the in the plane ( ).
Fig. 4. Corresponding axial OTFs calculated for the (blue solid line) and (red dashed line) when the value of is 0.3.
Fig. 5. Transverse intensity distributions in the focal plane when illuminated by (a) beams and (b) circularly polarized beams, respectively. (c) Intensity distributions of the in the plane ( ). (d) The corresponding lateral profiles of intensity distributions along the axis.
Zhiyuan Gu, Xianghui Wang, Jianxin Wang, Fei Fan, Shengjiang Chang. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging[J]. Chinese Optics Letters, 2019, 17(12): 121103.